Deep Learning for Advanced X-ray Detection and Imaging Applications

Name: Deep Learning for Advanced X-ray Detection and Imaging Applications
Brand: Krzysztof (Kris) Iniewski
SKU: 9783031756535
Price: 139.09 EUR
Availability: InStock

€139,09

inkl. MwSt. • Kein physischer Versand

Sofort per Download lieferbar

Ihr Downloadlink kommt direkt per E-Mail.

PDF: lesbar auf Smartphone, Tablet, Computer und in vielen PDF-Apps.

Anzahl:

E-Book

eBook-Format:PDF

Inhaltsangabe

Deep Learning Techniques for CT Image Denoising and Resolution Enhancement.- , Physically interpretable deep learning reconstruction for photon counting spectral CT.- , Deep learning methods in dual energy CT imaging.- , Performance Evaluation of Implicit Neural Representations in Diagnostic Fan-Beam CT Imaging.- , Learning-Based Material Decomposition for Spectral X-ray Imaging.- , Learning-Based Material Decomposition for Spectral X-ray Imaging.- , Correcting Charge Sharing Distortions in Photon Counting Detectors Utilizing a Spatial-Temporal CNN.- , Machine Learning Approaches for CdZnTe / CdTe Radiation Detectors.- , Enhanced 3D X-ray Tomography: Deep Learning-based Advanced Algorithms for Fiber Instance Segmentation.- , Machine Learning-Based Image Processing in Radiotherapy.- , Deep learning-based image reconstruction of coded-aperture imaging in nuclear security applications.- , Artificial Intelligence for X-ray Photon Counting Technology: Current Status and Future Perspectives.

Produktdetails

Erscheinungsdatum: 22.01.2025
Autor/Autorin: Krzysztof (Kris) Iniewski
Format: E-Book
Dateiformat: PDF
Kopierschutz: Wasserzeichen
Dateigröße: 36.2 MB
Verlag: SPRINGER
Sprache: Englisch
Umfang: 200 Seiten
ISBN: 9783031756535
Lieferung: Sofort per Download
Hinweis: Sofort per Download lieferbar. Kein physischer Versand.
Kompatibilität: Lesbar auf Geräten und Apps mit PDF-Unterstützung.

Herstellerinformationen

SPRINGER

Deep Learning for Advanced X-ray Detection and Imaging Applications

€139,09

Autor/Autorin

Krzysztof (Kris) Iniewski

Krzysztof (Kris) Iniewski is director of detector architecture and applications at Redlen Technologies Inc. in British Columbia, Canada. During his 15 years at Redlen he has managed development of highly integrated CdZnTe detector products in medical imaging and security applications. Prior to Redlen Kris hold various management and academic positions at PMC-Sierra, University of Alberta, SFU, UBC and University of Toronto.

Dr. Iniewski has published over 150+ research papers in international journals and conferences. He holds 25+ international patents granted in USA, Canada, France, Germany, and Japan. He wrote and edited 75+ books for Springer, Wiley, Cambridge University Press, Mc-Graw Hill, and CRC Press. He is a frequent invited speaker and has consulted for multiple organizations internationally. Recent metrics analysis showed: h index = 33, i10 index = 100, number of citations = 4259.

Alle Titel ansehen

Weitere E-Books von Krzysztof (Kris) Iniewski

Direct Conversion Semiconductor Radiation Detectors using Si, CdTe and CdZnTe

€96,29

This book provides readers a broad overview of some of the most recent advances in the field of direct conversion detectors. There are a good mixture of general chapters in both technology and applications. Readers will enjoy an in-depth review of the research topics conducted at leading research institutions in the world. The signal conversion of the direct conversion into analogue/digital value is covered and the author also provides a review of ROIC (Read Out Integrated Circuits) chips used for direct image sensors. This book should be an excellent reference for people already working in the field as well as for people wishing to enter it.

Zum Buch