{"product_id":"reliability-of-cmos-analog-ics-hakan-kuntman-ebook","title":"Reliability of CMOS Analog ICs","description":"\u003cp\u003eIntroduction.- The reliability model for PMOS and NMOS transistors based on statistical methods.- Demonstration of Proposed Method with Application Examples.- On the degradation of OTA-C–based CMOS low-power filter circuits for biomedical instrumentation.- Power MOSFET degradation and statistical investigation of the degradation effect on DC-DC converters and converter parameters.\u003c\/p\u003e","brand":"Hakan Kuntman","offers":[{"title":"Default Title","offer_id":53651856556359,"sku":"9783031854552","price":96.29,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0920\/5455\/2903\/files\/reliability-of-cmos-analog-ics-ebook-cover.webp?v=1775338513","url":"https:\/\/www.cinebuch.de\/products\/reliability-of-cmos-analog-ics-hakan-kuntman-ebook","provider":"CineBuch","version":"1.0","type":"link"}